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Applied Logistic Regression, Third Edition


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Authors:
David W. Hosmer, Jr., Stanley Lemeshow, and Rodney X. Sturdivant
Publisher: Wiley
Copyright: 2013
ISBN-13: 978-0-470-58247-3
Pages: 528; hardcover
Price: $94.75
Authors:
David W. Hosmer, Jr., Stanley Lemeshow, and Rodney X. Sturdivant
Publisher: Wiley
Copyright: 2013
ISBN-13:
Pages: 528; eBook
Price: $

Comment from the Stata technical group

The third edition of Applied Logistic Regression, by David W. Hosmer, Jr., Stanley Lemeshow, and Rodney X. Sturdivant, is the definitive reference on logistic regression models.

The book begins with chapters on fitting and interpreting binary logistic models as well as chapters on assessing model fit and selecting the appropriate covariates and transformations. Despite the modest title, however, the book goes much further. One chapter discusses different sampling schemes, including case–control data, cohort studies, and complex survey data; another chapter is dedicated to matched case–control studies. Later chapters discuss multinomial and ordinal logistic models for multiple-outcome responses and the analysis of correlated longitudinal data using population-average and cluster-specific models. The final chapter broaches advanced topics, including the use of logistic regression in propensity score methods, exact methods, Bayesian estimation, and mediation.

Most of the analyses in the book were performed using Stata and can be replicated using Stata and the data from the text. Also noteworthy is the book's use of multinomial fractional polynomial models that can be fit using Stata's mfp command.

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